Panjab University’s SAIF/CIL Unveils Cutting-Edge X-Ray Photoelectron Spectroscopy Instrument
The Sophisticated Analytical Instrumentation Facility (SAIF) at Panjab University is set to inaugurate its latest high-end analytical instrument, the X-Ray Photoelectron Spectroscopy (XPS) system. This state-of-the-art equipment, worth ₹5 crores, has been procured through a generous grant from the Department of Science and Technology (DST), New Delhi, reinforcing SAIF’s commitment to advancing scientific research.
The inauguration ceremony will be graced by the esteemed Dr. Gurtej Singh Sandhu, Principal Fellow and Vice President at Micron Technology, who will officially unveil the XPS instrument. Dr. Sandhu, a distinguished figure in the semiconductor industry, holds an impressive 1,382 U.S. utility patents, placing him among the top inventors globally. His pioneering work in thin-film processes and semiconductor device fabrication has significantly advanced memory chip technologies.
The event will take place in the august presence of Honorable Professor Renu Vig, Vice Chancellor, Panjab University, along with several former Directors of SAIF, whose invaluable contributions have played a pivotal role in shaping the facility into a premier research hub.
X-Ray Photoelectron Spectroscopy (XPS) is an indispensable tool in materials science, enabling precise analysis of surface chemistry, elemental composition, and chemical states. Its applications span diverse fields, device fabrication, nanotechnology, environmental science, and advanced materials research.
Under the leadership of Prof. Gaurav Verma, Director of SAIF/CIL, the facility continues to expand its research capabilities, fostering innovation and excellence in scientific exploration.
